forked from luck/tmp_suning_uos_patched
of: unittest: kmemleak in of_unittest_platform_populate()
kmemleak reports several memory leaks from devicetree unittest.
This is the fix for problem 2 of 5.
of_unittest_platform_populate() left an elevated reference count for
grandchild nodes (which are platform devices). Fix the platform
device reference counts so that the memory will be freed.
Fixes: fb2caa50fb
("of/selftest: add testcase for nodes with same name and address")
Reported-by: Erhard F. <erhard_f@mailbox.org>
Signed-off-by: Frank Rowand <frank.rowand@sony.com>
Signed-off-by: Rob Herring <robh@kernel.org>
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@ -1247,10 +1247,13 @@ static void __init of_unittest_platform_populate(void)
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of_platform_populate(np, match, NULL, &test_bus->dev);
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for_each_child_of_node(np, child) {
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for_each_child_of_node(child, grandchild)
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unittest(of_find_device_by_node(grandchild),
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for_each_child_of_node(child, grandchild) {
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pdev = of_find_device_by_node(grandchild);
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unittest(pdev,
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"Could not create device for node '%pOFn'\n",
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grandchild);
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of_dev_put(pdev);
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}
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}
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of_platform_depopulate(&test_bus->dev);
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