AcoSail/kernel_optimize_test
8
0
Fork 0
forked from luck/tmp_suning_uos_patched
Code Pull Requests Activity

[E1000E]: convert register test macros to functions

Browse Source 
Add functions for reg_pattern_test and reg_set_and check
Changed macros to use these functions

Compiled x86, untested

Size decreased ~2K

old:

$ size drivers/net/e1000e/ethtool.o
   text    data     bss     dec     hex filename
  14461       0       0   14461    387d drivers/net/e1000e/ethtool.o

new:

$ size drivers/net/e1000e/ethtool.o
   text    data     bss     dec     hex filename
  12498       0       0   12498    30d2 drivers/net/e1000e/ethtool.o

Signed-off-by: Joe Perches <joe@perches.com>
Signed-off-by: Auke Kok <auke-jan.h.kok@intel.com>
Signed-off-by: David S. Miller <davem@davemloft.net>
This commit is contained in:
Joe Perches 2007-11-13 20:53:51 -08:00 committed by David S. Miller
parent 7e64300a0f
commit 2a88719197
1 changed files with 53 additions and 31 deletions
Show Stats Download Patch File Download Diff File Expand all files Collapse all files

84
drivers/net/e1000e/ethtool.c
View File

@ -690,41 +690,63 @@ static int e1000_set_ringparam(struct net_device *netdev,
return err;
}
#define REG_PATTERN_TEST(R, M, W) REG_PATTERN_TEST_ARRAY(R, 0, M, W)
#define REG_PATTERN_TEST_ARRAY(reg, offset, mask, writeable) \
{ \
u32 _pat; \
u32 _value; \
u32 _test[] = {0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF}; \
for (_pat = 0; _pat < ARRAY_SIZE(_test); _pat++) { \
E1000_WRITE_REG_ARRAY(hw, reg, offset, \
(_test[_pat] & writeable)); \
_value = E1000_READ_REG_ARRAY(hw, reg, offset); \
if (_value != (_test[_pat] & writeable & mask)) { \
ndev_err(netdev, "pattern test reg %04X " \
"failed: got 0x%08X expected 0x%08X\n", \
reg + offset, \
value, (_test[_pat] & writeable & mask)); \
*data = reg; \
return 1; \
} \
} \
bool reg_pattern_test_array(struct e1000_adapter *adapter, u64 *data,
int reg, int offset, u32 mask, u32 write)
{
int i;
u32 read;
static const u32 test[] =
{0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF};
for (i = 0; i < ARRAY_SIZE(test); i++) {
E1000_WRITE_REG_ARRAY(&adapter->hw, reg, offset,
(test[i] & write));
read = E1000_READ_REG_ARRAY(&adapter->hw, reg, offset);
if (read != (test[i] & write & mask)) {
ndev_err(adapter->netdev, "pattern test reg %04X "
"failed: got 0x%08X expected 0x%08X\n",
reg + offset,
read, (test[i] & write & mask));
*data = reg;
return true;
}
}
return false;
}
#define REG_SET_AND_CHECK(R, M, W) \
{ \
u32 _value; \
__ew32(hw, R, W & M); \
_value = __er32(hw, R); \
if ((W & M) != (_value & M)) { \
ndev_err(netdev, "set/check reg %04X test failed: " \
"got 0x%08X expected 0x%08X\n", R, (_value & M), \
(W & M)); \
*data = R; \
return 1; \
} \
static bool reg_set_and_check(struct e1000_adapter *adapter, u64 *data,
int reg, u32 mask, u32 write)
{
u32 read;
__ew32(&adapter->hw, reg, write & mask);
read = __er32(&adapter->hw, reg);
if ((write & mask) != (read & mask)) {
ndev_err(adapter->netdev, "set/check reg %04X test failed: "
"got 0x%08X expected 0x%08X\n", reg, (read & mask),
(write & mask));
*data = reg;
return true;
}
return false;
}
#define REG_PATTERN_TEST(R, M, W) \
do { \
if (reg_pattern_test_array(adapter, data, R, 0, M, W)) \
return 1; \
} while (0)
#define REG_PATTERN_TEST_ARRAY(R, offset, M, W) \
do { \
if (reg_pattern_test_array(adapter, data, R, offset, M, W)) \
return 1; \
} while (0)
#define REG_SET_AND_CHECK(R, M, W) \
do { \
if (reg_set_and_check(adapter, data, R, M, W)) \
return 1; \
} while (0)
static int e1000_reg_test(struct e1000_adapter *adapter, u64 *data)
{
struct e1000_hw *hw = &adapter->hw;