forked from luck/tmp_suning_uos_patched
drm/amd/display: Align macro name as per DP spec
[Why]: Aligh with DP spec wanted to follow same naming convention. [How]: Changed the macro name of the dpcd address used for getting requested test-pattern. Cc: Harry Wentland <harry.wentland@amd.com> Cc: Alex Deucher <alexander.deucher@amd.com> Reviewed-by: Harry Wentland <harry.wentland@amd.com> Reviewed-by: Manasi Navare <manasi.d.navare@intel.com> Signed-off-by: Animesh Manna <animesh.manna@intel.com> Signed-off-by: Maarten Lankhorst <maarten.lankhorst@linux.intel.com> Link: https://patchwork.freedesktop.org/patch/msgid/20200316103759.12867-2-animesh.manna@intel.com
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@ -2530,7 +2530,7 @@ static void dp_test_send_phy_test_pattern(struct dc_link *link)
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/* get phy test pattern and pattern parameters from DP receiver */
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core_link_read_dpcd(
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link,
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DP_TEST_PHY_PATTERN,
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DP_PHY_TEST_PATTERN,
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&dpcd_test_pattern.raw,
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sizeof(dpcd_test_pattern));
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core_link_read_dpcd(
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@ -701,7 +701,7 @@
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# define DP_TEST_CRC_SUPPORTED (1 << 5)
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# define DP_TEST_COUNT_MASK 0xf
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#define DP_TEST_PHY_PATTERN 0x248
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#define DP_PHY_TEST_PATTERN 0x248
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#define DP_TEST_80BIT_CUSTOM_PATTERN_7_0 0x250
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#define DP_TEST_80BIT_CUSTOM_PATTERN_15_8 0x251
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#define DP_TEST_80BIT_CUSTOM_PATTERN_23_16 0x252
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