forked from luck/tmp_suning_uos_patched
f627248736
Fix onenand_wait error reporting Signed-off-by: Kyungmin Park <kyungmin.park@samsung.com>
248 lines
6.7 KiB
C
248 lines
6.7 KiB
C
/*
|
|
* linux/drivers/mtd/onenand/onenand_bbt.c
|
|
*
|
|
* Bad Block Table support for the OneNAND driver
|
|
*
|
|
* Copyright(c) 2005 Samsung Electronics
|
|
* Kyungmin Park <kyungmin.park@samsung.com>
|
|
*
|
|
* Derived from nand_bbt.c
|
|
*
|
|
* TODO:
|
|
* Split BBT core and chip specific BBT.
|
|
*/
|
|
|
|
#include <linux/slab.h>
|
|
#include <linux/mtd/mtd.h>
|
|
#include <linux/mtd/onenand.h>
|
|
#include <linux/mtd/compatmac.h>
|
|
|
|
extern int onenand_do_read_oob(struct mtd_info *mtd, loff_t from, size_t len,
|
|
size_t *retlen, u_char *buf);
|
|
|
|
/**
|
|
* check_short_pattern - [GENERIC] check if a pattern is in the buffer
|
|
* @param buf the buffer to search
|
|
* @param len the length of buffer to search
|
|
* @param paglen the pagelength
|
|
* @param td search pattern descriptor
|
|
*
|
|
* Check for a pattern at the given place. Used to search bad block
|
|
* tables and good / bad block identifiers. Same as check_pattern, but
|
|
* no optional empty check and the pattern is expected to start
|
|
* at offset 0.
|
|
*
|
|
*/
|
|
static int check_short_pattern(uint8_t *buf, int len, int paglen, struct nand_bbt_descr *td)
|
|
{
|
|
int i;
|
|
uint8_t *p = buf;
|
|
|
|
/* Compare the pattern */
|
|
for (i = 0; i < td->len; i++) {
|
|
if (p[i] != td->pattern[i])
|
|
return -1;
|
|
}
|
|
return 0;
|
|
}
|
|
|
|
/**
|
|
* create_bbt - [GENERIC] Create a bad block table by scanning the device
|
|
* @param mtd MTD device structure
|
|
* @param buf temporary buffer
|
|
* @param bd descriptor for the good/bad block search pattern
|
|
* @param chip create the table for a specific chip, -1 read all chips.
|
|
* Applies only if NAND_BBT_PERCHIP option is set
|
|
*
|
|
* Create a bad block table by scanning the device
|
|
* for the given good/bad block identify pattern
|
|
*/
|
|
static int create_bbt(struct mtd_info *mtd, uint8_t *buf, struct nand_bbt_descr *bd, int chip)
|
|
{
|
|
struct onenand_chip *this = mtd->priv;
|
|
struct bbm_info *bbm = this->bbm;
|
|
int i, j, numblocks, len, scanlen;
|
|
int startblock;
|
|
loff_t from;
|
|
size_t readlen, ooblen;
|
|
|
|
printk(KERN_INFO "Scanning device for bad blocks\n");
|
|
|
|
len = 1;
|
|
|
|
/* We need only read few bytes from the OOB area */
|
|
scanlen = ooblen = 0;
|
|
readlen = bd->len;
|
|
|
|
/* chip == -1 case only */
|
|
/* Note that numblocks is 2 * (real numblocks) here;
|
|
* see i += 2 below as it makses shifting and masking less painful
|
|
*/
|
|
numblocks = mtd->size >> (bbm->bbt_erase_shift - 1);
|
|
startblock = 0;
|
|
from = 0;
|
|
|
|
for (i = startblock; i < numblocks; ) {
|
|
int ret;
|
|
|
|
for (j = 0; j < len; j++) {
|
|
size_t retlen;
|
|
|
|
/* No need to read pages fully,
|
|
* just read required OOB bytes */
|
|
ret = onenand_do_read_oob(mtd, from + j * mtd->writesize + bd->offs,
|
|
readlen, &retlen, &buf[0]);
|
|
|
|
/* If it is a initial bad block, just ignore it */
|
|
if (ret && !(ret & ONENAND_CTRL_LOAD))
|
|
return ret;
|
|
|
|
if (check_short_pattern(&buf[j * scanlen], scanlen, mtd->writesize, bd)) {
|
|
bbm->bbt[i >> 3] |= 0x03 << (i & 0x6);
|
|
printk(KERN_WARNING "Bad eraseblock %d at 0x%08x\n",
|
|
i >> 1, (unsigned int) from);
|
|
mtd->ecc_stats.badblocks++;
|
|
break;
|
|
}
|
|
}
|
|
i += 2;
|
|
from += (1 << bbm->bbt_erase_shift);
|
|
}
|
|
|
|
return 0;
|
|
}
|
|
|
|
|
|
/**
|
|
* onenand_memory_bbt - [GENERIC] create a memory based bad block table
|
|
* @param mtd MTD device structure
|
|
* @param bd descriptor for the good/bad block search pattern
|
|
*
|
|
* The function creates a memory based bbt by scanning the device
|
|
* for manufacturer / software marked good / bad blocks
|
|
*/
|
|
static inline int onenand_memory_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd)
|
|
{
|
|
struct onenand_chip *this = mtd->priv;
|
|
|
|
bd->options &= ~NAND_BBT_SCANEMPTY;
|
|
return create_bbt(mtd, this->page_buf, bd, -1);
|
|
}
|
|
|
|
/**
|
|
* onenand_isbad_bbt - [OneNAND Interface] Check if a block is bad
|
|
* @param mtd MTD device structure
|
|
* @param offs offset in the device
|
|
* @param allowbbt allow access to bad block table region
|
|
*/
|
|
static int onenand_isbad_bbt(struct mtd_info *mtd, loff_t offs, int allowbbt)
|
|
{
|
|
struct onenand_chip *this = mtd->priv;
|
|
struct bbm_info *bbm = this->bbm;
|
|
int block;
|
|
uint8_t res;
|
|
|
|
/* Get block number * 2 */
|
|
block = (int) (offs >> (bbm->bbt_erase_shift - 1));
|
|
res = (bbm->bbt[block >> 3] >> (block & 0x06)) & 0x03;
|
|
|
|
DEBUG(MTD_DEBUG_LEVEL2, "onenand_isbad_bbt: bbt info for offs 0x%08x: (block %d) 0x%02x\n",
|
|
(unsigned int) offs, block >> 1, res);
|
|
|
|
switch ((int) res) {
|
|
case 0x00: return 0;
|
|
case 0x01: return 1;
|
|
case 0x02: return allowbbt ? 0 : 1;
|
|
}
|
|
|
|
return 1;
|
|
}
|
|
|
|
/**
|
|
* onenand_scan_bbt - [OneNAND Interface] scan, find, read and maybe create bad block table(s)
|
|
* @param mtd MTD device structure
|
|
* @param bd descriptor for the good/bad block search pattern
|
|
*
|
|
* The function checks, if a bad block table(s) is/are already
|
|
* available. If not it scans the device for manufacturer
|
|
* marked good / bad blocks and writes the bad block table(s) to
|
|
* the selected place.
|
|
*
|
|
* The bad block table memory is allocated here. It must be freed
|
|
* by calling the onenand_free_bbt function.
|
|
*
|
|
*/
|
|
int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd)
|
|
{
|
|
struct onenand_chip *this = mtd->priv;
|
|
struct bbm_info *bbm = this->bbm;
|
|
int len, ret = 0;
|
|
|
|
len = mtd->size >> (this->erase_shift + 2);
|
|
/* Allocate memory (2bit per block) and clear the memory bad block table */
|
|
bbm->bbt = kzalloc(len, GFP_KERNEL);
|
|
if (!bbm->bbt) {
|
|
printk(KERN_ERR "onenand_scan_bbt: Out of memory\n");
|
|
return -ENOMEM;
|
|
}
|
|
|
|
/* Set the bad block position */
|
|
bbm->badblockpos = ONENAND_BADBLOCK_POS;
|
|
|
|
/* Set erase shift */
|
|
bbm->bbt_erase_shift = this->erase_shift;
|
|
|
|
if (!bbm->isbad_bbt)
|
|
bbm->isbad_bbt = onenand_isbad_bbt;
|
|
|
|
/* Scan the device to build a memory based bad block table */
|
|
if ((ret = onenand_memory_bbt(mtd, bd))) {
|
|
printk(KERN_ERR "onenand_scan_bbt: Can't scan flash and build the RAM-based BBT\n");
|
|
kfree(bbm->bbt);
|
|
bbm->bbt = NULL;
|
|
}
|
|
|
|
return ret;
|
|
}
|
|
|
|
/*
|
|
* Define some generic bad / good block scan pattern which are used
|
|
* while scanning a device for factory marked good / bad blocks.
|
|
*/
|
|
static uint8_t scan_ff_pattern[] = { 0xff, 0xff };
|
|
|
|
static struct nand_bbt_descr largepage_memorybased = {
|
|
.options = 0,
|
|
.offs = 0,
|
|
.len = 2,
|
|
.pattern = scan_ff_pattern,
|
|
};
|
|
|
|
/**
|
|
* onenand_default_bbt - [OneNAND Interface] Select a default bad block table for the device
|
|
* @param mtd MTD device structure
|
|
*
|
|
* This function selects the default bad block table
|
|
* support for the device and calls the onenand_scan_bbt function
|
|
*/
|
|
int onenand_default_bbt(struct mtd_info *mtd)
|
|
{
|
|
struct onenand_chip *this = mtd->priv;
|
|
struct bbm_info *bbm;
|
|
|
|
this->bbm = kzalloc(sizeof(struct bbm_info), GFP_KERNEL);
|
|
if (!this->bbm)
|
|
return -ENOMEM;
|
|
|
|
bbm = this->bbm;
|
|
|
|
/* 1KB page has same configuration as 2KB page */
|
|
if (!bbm->badblock_pattern)
|
|
bbm->badblock_pattern = &largepage_memorybased;
|
|
|
|
return onenand_scan_bbt(mtd, bbm->badblock_pattern);
|
|
}
|
|
|
|
EXPORT_SYMBOL(onenand_scan_bbt);
|
|
EXPORT_SYMBOL(onenand_default_bbt);
|